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Diffstat (limited to 'examples/fsmc-stress-test.cpp')
| -rw-r--r-- | examples/fsmc-stress-test.cpp | 216 |
1 files changed, 216 insertions, 0 deletions
diff --git a/examples/fsmc-stress-test.cpp b/examples/fsmc-stress-test.cpp new file mode 100644 index 0000000..12e8650 --- /dev/null +++ b/examples/fsmc-stress-test.cpp @@ -0,0 +1,216 @@ +/* + + A low-level stress test of SRAM functionality. Uses slow-ish timing + by default (DATAST = ADDSET = 0xF). + + Copyright 2011 LeafLabs, LLC. + + This code is released into the public domain. + + */ + +#include <stdio.h> +#include <stddef.h> + +#include "wirish.h" +#include "rcc.h" +#include "fsmc.h" + +// -- SRAM config ------------------------------------------------------------- + +// Timing configuration +#define DATAST 0xF +#define ADDSET 0xF + +// Number of SRAM chips to test +#define N 1 + +// How much of each to test +#define MEM_SIZE 0x3FFF + +// Their start addresses in FSMC bank 1 +__io uint16 *const starts[N] = { + // (__io uint16 *const)FSMC_NOR_PSRAM_REGION1, + // (__io uint16 *const)FSMC_NOR_PSRAM_REGION2, + (__io uint16 *const)FSMC_NOR_PSRAM_REGION3, + // (__io uint16 *const)FSMC_NOR_PSRAM_REGION4, +}; + +// Corresponding FSMC configuration registers +__io uint32 *const bcrs[N] = { + // &FSMC_NOR_PSRAM1_BASE->BCR, + // &FSMC_NOR_PSRAM2_BASE->BCR, + &FSMC_NOR_PSRAM3_BASE->BCR, + // &FSMC_NOR_PSRAM4_BASE->BCR, +}; + +// Corresponding FSMC timing registers +__io uint32 *const btrs[N] = { + // &FSMC_NOR_PSRAM1_BASE->BTR, + // &FSMC_NOR_PSRAM2_BASE->BTR, + &FSMC_NOR_PSRAM3_BASE->BTR, + // &FSMC_NOR_PSRAM4_BASE->BTR, +}; + +// -- Pseudorandom number generation ----------------------------------------- + +const uint32 seed = 0xDEADBEEF; + +uint32 num_rand_calls = 0; + +uint32 rand(long n) { + num_rand_calls++; + return random(n); +} + +// -- Printing ---------------------------------------------------------------- + +// For snprintf() +char snprintf_buf[200]; + +#define ERR(fmt, ...) do { \ + snprintf(snprintf_buf, sizeof snprintf_buf, \ + "ERROR: " fmt " (seed %d, ncalls %d, line %d)", \ + __VA_ARGS__, seed, num_rand_calls, __LINE__); \ + Serial1.println(snprintf_buf); \ + } while (0) + +// -- setup()/loop() ---------------------------------------------------------- + +void setup() { + fsmc_sram_init_gpios(); + rcc_clk_enable(RCC_FSMC); + + for (int i = 0; i < N; i++) { + *bcrs[i] = (FSMC_BCR_WREN | + FSMC_BCR_MTYP_SRAM | + FSMC_BCR_MWID_16BITS | + FSMC_BCR_MBKEN); + *btrs[i] = (DATAST << 8) | ADDSET; + } + + Serial1.begin(115200); + randomSeed(seed); +} + +// stress_test() and simple_roundtrip() are the available test routines +bool stress_test(void); +bool simple_roundtrip(void); + +void loop() { + uint32 count = 0; + bool ok = true; + bool (*test)(void) = stress_test; + + while (true) { + count++; + bool result = test(); + ok = ok && result; + if (ok) { + snprintf(snprintf_buf, sizeof snprintf_buf, + "everything ok so far, timestamp %d ms", millis()); + Serial1.println(snprintf_buf); + } + } +} + +// -- Test routines ----------------------------------------------------------- + +bool random_trips(); +bool sequential_trips(); + +bool stress_test(void) { + static int i = 0; + i = !i; + + switch (i) { + case 0: + return random_trips(); + default: + return sequential_trips(); + } +} + +bool simple_roundtrip(void) { + uint16 wval = 0xAB; + + for (int i = 0; i < N; i++) { + __io uint16 *addr = starts[i] + 4; + snprintf(snprintf_buf, sizeof snprintf_buf, "round-trip 0x%x at %p", + wval, addr); + Serial1.println(snprintf_buf); + + *addr = wval; + uint16 rval = *addr; + + if (rval != wval) { + ERR("wrote 0x%x, read 0x%x, timestamp %d", wval, rval, millis()); + return false; + } else { + snprintf(snprintf_buf, sizeof snprintf_buf, "got back 0x%x", rval); + Serial1.println(snprintf_buf); + } + } + + return true; +} + +bool random_trips(void) { + for (int n = 0; n < N; n++) { + __io uint16 *const start = starts[n]; + + for (int i = 0; i < 1000; i++) { + uint32 offset = rand(MEM_SIZE); + uint32 wval = rand(0xFFFF); + + *(start + offset) = wval; + uint32 rval = *(start + offset); + + if (rval != wval) { + ERR("wrote 0x%x to 0x%x, read 0x%x", wval, offset, rval); + return false; + } + } + } + return true; +} + +bool sequential_trips(void) { + static const uint32 seq_length = 300; + + for (int n = 0; n < N; n++) { + __io uint16 *const start = starts[n]; + + for (int i = 0; i < 100; i++) { + uint32 start_offset = rand(MEM_SIZE - seq_length); + + for (uint32 w = 0; w < seq_length; w++) { + uint32 offset = start_offset + w; + + *(start + offset) = w; + uint32 r = *(start + offset); + + if (w != r) { + ERR("wrote 0x%x to 0x%x, read 0x%x", w, offset, r); + return false; + } + } + } + } + return true; +} + +// ---------------------------------------------------------------------------- + +__attribute__((constructor)) void premain() { + init(); +} + +int main(void) { + setup(); + while (true) { + loop(); + } + return 0; +} + |